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fio: Remove the trim step from full_bench.fio
The test already writes to the entire device twice, so the trim step does not actually accomplish anything. Change-Id: Ie761389511196d659358f18f557feb80087628cc Signed-off-by:Ben Walker <benjamin.walker@intel.com> Reviewed-on: https://review.gerrithub.io/393832 Reviewed-by:
Jim Harris <james.r.harris@intel.com> Tested-by:
SPDK Automated Test System <sys_sgsw@intel.com> Reviewed-by:
Changpeng Liu <changpeng.liu@intel.com>