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1. Use the Raid-0 bdev which based two Malloc bdevs to run the fio test. 2. Use the Raid-0 bdev which based one Nvme bdev and one malloc bdev to run fio test. 3. Creating lvol store on device Raid-0 which is based on two Malloc bdevs. Change-Id: I3fb5e5d8e445a236a6a4e8c198a6f54a1f488989 Signed-off-by:Chen Wang <chenx.wang@intel.com> Reviewed-on: https://review.gerrithub.io/425546 Tested-by:
SPDK CI Jenkins <sys_sgci@intel.com> Reviewed-by:
Pawel Wodkowski <pawelx.wodkowski@intel.com> Reviewed-by:
Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com> Reviewed-by:
Piotr Pelpliński <piotr.pelplinski@intel.com> Reviewed-by:
Jim Harris <james.r.harris@intel.com> Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>