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ut/thread: Test creating and destroying nested I/O channels
This patch creates a test case to simulate nested I/O channels by generic bdev layer and bdev modules. The nested level of I/O channels is two at a maximum now but the nested level of the test case is three. Besides, any poller registered on the nested I/O channel is not visible to the upper layer. So include such pollers into the test case. By combining thread termination, test the fix for the github issue is correct. Signed-off-by:Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com> Change-Id: I6a04d753e462cdaba7364678b5118c45b09708ca Reviewed-on: https://review.spdk.io/gerrit/c/spdk/spdk/+/1390 Tested-by:
SPDK CI Jenkins <sys_sgci@intel.com> Reviewed-by:
Aleksey Marchuk <alexeymar@mellanox.com> Reviewed-by:
Ben Walker <benjamin.walker@intel.com> Reviewed-by:
Jim Harris <james.r.harris@intel.com> Community-CI: Broadcom CI