Commit 8ef7818a authored Aug 21, 2018 by Jim Harris

test/bdev: properly cleanup bdev layer in bdev_io_wait_test



A new unit test in an upcoming patch will initialize the bdev
layer separately, so modify the existing tests now so that
they properly cleanup the bdev layer after the unit test
that initialized it is complete.

Signed-off-by: Jim Harris <james.r.harris@intel.com>
Change-Id: Ie00837a90391ca4d0dd578e978fb26483fe5c0cf

Reviewed-on: https://review.gerrithub.io/423023


Tested-by: SPDK CI Jenkins <sys_sgci@intel.com>
Chandler-Test-Pool: SPDK Automated Test System <sys_sgsw@intel.com>
Reviewed-by: Ben Walker <benjamin.walker@intel.com>
Reviewed-by: Changpeng Liu <changpeng.liu@intel.com>
Reviewed-by: Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com>

parent 9f2dd0c4

test/unit/lib/bdev/bdev.c/bdev_ut.c

+7 −0

Original line number	Diff line number	Diff line
		@@ -158,6 +158,7 @@ bdev_ut_module_init(void)
		static void
		bdev_ut_module_fini(void)
		{
		spdk_io_device_unregister(&g_bdev_ut_io_device, NULL);
		}

		struct spdk_bdev_module bdev_ut_if = {
		@@ -595,6 +596,11 @@ bdev_init_cb(void *arg, int rc)
		CU_ASSERT(rc == 0);
		}

		static void
		bdev_fini_cb(void *arg)
		{
		}

		struct bdev_ut_io_wait_entry {
		struct spdk_bdev_io_wait_entry entry;
		struct spdk_io_channel *io_ch;
		@@ -685,6 +691,7 @@ bdev_io_wait_test(void)
		spdk_put_io_channel(io_ch);
		spdk_bdev_close(desc);
		free_bdev(bdev);
		spdk_bdev_finish(bdev_fini_cb, NULL);
		}

		int