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bdev/raid: remove random test case values
For test setup only, each time a UT would run several params, like the number of drives in the test, would be based on a random value which is not optimal for UT. This patch just selects a reasonable fixed values and uses them every time. This can save up to 4 seconds per run depending on the values that were randomly chosen (worst case) vs what is in this patch. There is value in some read/write test cases in using different strip sizes however. Enabling multiples values for the tests where it adds value will come in following patches as will removal of more random numbers like # of channels. Change-Id: I1b9d44b70ae81af0dcf53ae4a56e31c9c9add39e Signed-off-by:paul luse <paul.e.luse@intel.com> Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/454505 Tested-by:
SPDK CI Jenkins <sys_sgci@intel.com> Reviewed-by:
Shuhei Matsumoto <shuhei.matsumoto.xt@hitachi.com> Reviewed-by:
Jim Harris <james.r.harris@intel.com>