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test/iscsi_tgt: fix fio nightly test
fio write test on null bdev always fails. This patch replaces null bdev with malloc bdev to perform write test. Change-Id: I3192da5445c510227f53209cf27d819b58b3b6e0 Signed-off-by:Tomasz Kulasek <tomaszx.kulasek@intel.com> Reviewed-on: https://review.gerrithub.io/c/spdk/spdk/+/461905 Reviewed-by:
Darek Stojaczyk <dariusz.stojaczyk@intel.com> Reviewed-by:
Changpeng Liu <changpeng.liu@intel.com> Tested-by:
SPDK CI Jenkins <sys_sgci@intel.com>